| Function: | Test, Lift out |
|---|---|
| Application: | Test, Dissection, R&D |
| Certification: | CE |
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High Precision Tungsten Probe Tips for FIB TEM IC Chip Testing -
OEM Custom Nano Tip Needle
Our high-precision tungsten probe tips are designed for demanding applications that require exceptional strength, electrical conductivity, and tip sharpness. These probes are custom-machined with tip areas as small as 1 micron, and are widely used in semiconductor testing, microdissection, material analysis, and clean energy sectors. Each probe is manufactured using premium-grade materials to ensure durability, stability, and accuracy under extreme conditions.
Specifications and Customization Range
To meet your unique performance and design needs, we offer a wide range of specifications that can be tailored to your application.
| Parameter | Range |
|---|---|
| Tip Size | 1 μm - 50 μm |
| Tip Shape | Standard, Conical, Flat, Custom |
| Probe Diameter | 0.076 mm - 1.2 mm |
| Length | 15 mm - 300 mm |
| Tolerance | ±0.001 mm |
| Surface Finish | Polished, Ground, Coated |
| Angle/Tip Forming | Custom available (laser cut, micro-grind) |
Material Options:
Pure tungsten ≥99.95%
Rhenium tungsten alloy (optional)
Japanese tungsten available upon request
Precision Machining:
Tip radius down to 50 nanometers
Machining tolerance ±0.001 mm
Cone smoothness: Ra ≤ 0.25 (mirror finish)
Custom Tip Shapes:
Sharp / Ultra-sharp
Flat platform
Arc-shaped
Custom Coatings & Sleeves:
Full or partial Nickel tin plating, Gold plating
Optional die-cast copper or stainless steel sleeve
Strict Quality Control:
Each needle 100% inspected individually before shipment
SEM and optical testing available upon request
Applications
Professionals across multiple industries trust tungsten probe tips from Yolo for their exceptional precision and endurance.
Here's how our probes are used in the real world:
In LED manufacturing, probes must make precise electrical contact with tiny chip surfaces without causing damage.
Why our probes are ideal:
High hardness and elasticity prevent bending or tip deformation.
Non-destructive probing protects sensitive chip structures.
Custom tip shapes improve contact and reduce false signals.
Used in: Chip testing equipment, probe stations, and automated LED quality control setups.
Semiconductor fabs rely on ultra-precise probing for wafer-level testing, failure analysis, and debugging of integrated circuits.
Why our probes are ideal:
Sub-micron tip radius for contacting densely packed test pads.
Reliable conductivity ensures accurate voltage/current readings.
Compatibility with probe cards and precision manipulators.
Used in: Wafer sorters, memory and logic IC testing, R&D labs.
In FIB-based sample prep, especially for TEM lamella lift-out, tungsten probes act as manipulators to lift and place ultra-thin samples.
Why our probes are ideal:
Custom tip shapes compatible with Thermo Fisher EasyLift, Zeiss, and other systems.
Tip radius as small as 50 nanometers ensures minimal contact force.
Ra0.25 or better finish for clean handling under electron and ion beams.
Used in: Failure analysis labs, nano-fabrication labs, academic research facilities.
TEM requires samples that are ultra-thin and cleanly lifted from the substrate. Probe tips help extract these from the bulk material.
Why our probes are ideal:
Strong yet precise enough to lift fragile lamella without breakage.
Customization to fit different lift-out grid holders.
No tip contamination ensures clearer TEM imaging results.
Used in: Transmission electron microscopy, materials research, nanoscale defect analysis.
MEMS and micro-mechanical systems require fine-scale manipulation and mechanical testing with precision force application.
Why our probes are ideal:
High stiffness and elasticity for applying nano-Newton-scale forces.
Optional coatings and sleeves to adapt to varied materials.
Smooth tips reduce risk of breakage or sample scratching.
Used in: MEMS testing platforms, nano-indentation systems, material deformation analysis.
To meet different performance and environmental needs, our probe tips are available in four high-quality material options. Each material is selected based on its unique mechanical, electrical, and thermal properties, making them suitable for various industrial and research applications.
| Material | Code | Probe Diameter Range (mm) | Length Range (mm) | Tip Area (μm) | Density (g/cm³) | Resistivity at 20°C (μΩ·cm) | Melting Temp (°C) | Yield Strength (MPa) | Hardness (Knoop) | Modulus of Elasticity (GPa) | Composition |
|---|---|---|---|---|---|---|---|---|---|---|---|
| Pure Tungsten | W | 0.076 - 1.2 | 15 - 300 | 0.08 - 50 | 19.3 | ~5.65 | 3410 | 2900 | 740 | 400 | Tungsten 99.98% |
| Al, Si, K Doped Tungsten | W | 0.076 - 1.2 | 15 - 300 | 0.08 - 50 | 19.3 | ~5.65 | 3410 | 2900 | 740 | 400 | Tungsten 99.95% |
| Rhenium Tungsten | WRe | 0.076 - 1.0 | 15 - 250 | 0.08 - 50 | 19.3 | ~9.65 | 3427 | 3360 | 780 | 410 | Tungsten 97% + Rhenium 3% |
| Paliney 7 | Pa7 | 0.3 - 0.8 | 15 - 50 | 1 - 20 | 11.8 | ~31.6 | 1016 | 930 | 380 | 117 | Noble Alloy |
Pure Tungsten - Ideal for general-purpose probing where high hardness and high melting point are critical.
AlSiK Doped Tungsten - Offers slightly improved grain structure stability; preferred for ultra-fine tips.
Rhenium Tungsten (WRe) - Higher strength and elasticity; ideal for high-temperature or dynamic probing.
Paliney 7 - Precious alloy with excellent electrical conductivity and corrosion resistance; ideal for delicate or highly conductive applications.
We support material customization to match your exact application. Just let us know your testing environment or target equipment, and we'll recommend the best match.
With decades of experience in precision tungsten and molybdenum manufacturing, Yolo provides high-quality probe tips trusted in the semiconductor, medical, and environmental industries. We control every step of the production-from raw material to final product-to guarantee performance and consistency.
Premium Material Control: We process from our tungsten to ensure stable, high-purity raw material quality.
Ultra-Fine Precision Machining: Proven tip control down to 50nm, with 0.001mm machining tolerance.
100% Inspection: Each tip undergoes full optical inspection before packing.
Full Custom Support: We work closely with clients to meet design drawings and system fit.
Trusted Supplier: Supplying probe solutions to top-tier LED and semiconductor brands.
Packaging: Anti-static boxes/custom blister trays / protective tubes
Delivery: 15-20 working days, depending on customization
MOQ: Negotiable (sample orders supported)
We welcome OEM/ODM orders and support small-volume precision testing probes. Click "Contact Supplier" to get your tailored solution!
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